Services

Our services have many applications in forensic matters and failure analyses. We provide valuable resources which can be applied to fields diverse as metallurgical failure analysis, product liability, production issues and mining geology. 

We provide the space and equipment which can be used by qualified individuals to complete full inspections and analyses.  If additional techniques are required, we can arrange for or recommend other qualified laboratories.

 A SEM is a valuable analytical tool.  It allows for a non-destructive examination of various types of materials.

Unlike optical microscopy, which traditionally uses light to form an image, the SEM uses electrons to generate an image.  

Since electrons are used instead of light, the sample must be conductive, such as a metal fragment.  If the sample is not conductive, such as a ceramic, the sample typically is sputter coated with carbon, gold or iridium, to allow for proper imaging in the SEM. 

Some advantages of the SEM versus optical microscopy are a greater depth of focus and ability to resolve details on the surface of the sample.  

It also can be combined with a detector for energy dispersive spectroscopy (EDS), used to identify the elemental constituents of a sample.  

A disadvantage of SEM versus optical microscopy is the presence of color.  Optical images provide color variations which are not observed in the SEM images, which are shades of grey. Therefore, it is useful to examine samples optically before placing them in the SEM. 

Energy dispersive x-ray spectroscopy (EDS or EDAX) is a valuable tool in the world of analytical testing.

EDS allows for an elemental analysis of any sample placed inside the SEM, a perk of analyzing samples with the SEM.  Since the sample is being bombarded with electrons, the various elemental constituents are also generating their own characteristic xrays.  These xrays are collected and displayed in a spectrum.

This is a very useful in material identification, failure analysis and any other situation in which the elemental constituents of a sample need to be identified.

A few examples of how EDS can be used to identify:

• Unknown material found during production
• Metal transfer during electrical arcing
• Dental amalgam constituents

 A SEM is a valuable analytical tool.  It allows for a non-destructive examination of various types of materials.

Unlike optical microscopy, which traditionally uses light to form an image, the SEM uses electrons to generate an image.  

Since electrons are used instead of light, the sample must be conductive, such as a metal fragment.  If the sample is not conductive, such as a ceramic, the sample typically is sputter coated with carbon, gold or iridium, to allow for proper imaging in the SEM. 

Some advantages of the SEM versus optical microscopy are a greater depth of focus and ability to resolve details on the surface of the sample.  

It also can be combined with a detector for energy dispersive spectroscopy (EDS), used to identify the elemental constituents of a sample.  

A disadvantage of SEM versus optical microscopy is the presence of color.  Optical images provide color variations which are not observed in the SEM images, which are shades of grey. Therefore, it is useful to examine samples optically before placing them in the SEM. 

 We currently have digital x-ray capabilities.  In the past, xray images were produced using a x-ray source and Polaroid film.  Now that Polaroid has been discontinued, we have upgraded to new method.  

Unlike Polaroid which had to be developed, our method collects the image off our reusable collection sheet via a laser scanner and then generates a digital xray image.

Since the sheet is reusable, the cost of doing x-ray work is significantly decreased and allows for adjustments to be made, such as exposure time, without wasting any film.

Xray imaging of samples can provide useful information without having to alter or destroy the sample.  Several examples where xrays are useful:

• Fire Debris – locating and identifying material components in fire debris
• Product Failures – locating cracks in material, identifying relative locations in component systems prior to disassembly. 

 Hardness testing is one of the most widely used mechanical testing of materials.

It is a easy, simple test which allows for valuable information about the sample to be obtained.

This information can then be correlated back to other properties of the material or the conditions to which the material has been subjected.

Current available techniques include Rockwell Superficial, Knoop and Vicker's Hardness testing. 

 Cross-sectioning involves making a 'slice' through a sample.  

Once all other examinations have been completed, a sample is encased in a mounting medium, such as bakelite or epoxy.  Once completely cured, the sample can then be ground down to a flat surface and polished.  

This type of analysis has various applications, such as:

• Identifying the microstructure of a sample
• Determining plating thickness
• Failure analysis
  

We also have the capabilities of doing high precision cross sections through silicon die.  

This type of cross-sectioning allows for visual inspections of diffusion depths and other aspects of the individual die.